Organizing Committee
General chairman: Andrea Irace, University of Naples Federico II, Italy
General co-chairman: Giovanni Breglio, University of Naples Federico II, Italy
Technical Program Committee chairman: Munaf Rahimo, mqSemi, Switzerland, Italy
Tutorial Day chairman, Francesco La Via, CNR-IMM, Catania, Italy
Publication chair: Michele Riccio, University of Naples Federico II, Italy
Industrial chair: Luca Maresca, University of Naples Federico II, Italy
ICSCRM Steering Committee
Chair: Michael Krieger, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
Vice-chair: Philip G. Neudeck, NASA Glenn Research Center, USA
Elif Balkas, Wolspeed, USA
Peder Bergman, Linköping University, Sweden
Didier Chaussende, CNRS / Université Grenoble Alpes, France
Danilo Crippa, LPE, Italy
Hrishikesh Das, onsemi, USA
Michael Dudley, Stony Brook University, USA
Peter Friedrichs, Infineon, Germany/Austria
Adam Gali, Wigner Research Centre for Physics, Hungary
Hisayoshi Itoh, National Institutes for Quantum Science and Technology (QST), Japan
Nam Kyun Kim, Korea Electrotechnology Research Institute, Korea
Tsunenobu Kimoto, Kyoto University, Japan
Alexander Lebedev, Ioffe Institute, Russia
Phil Mawby, University of Warwick, UK
Noboru Ohtani, Kwansei Gakuin University, Japan
Hajime Okumura, National Institute of Advanced Industrial Science and Technology (AIST), Japan
Dominique Planson, University of Lyon, France
Fabrizio Roccaforte, CNR-IMM, Italy
Adolf Schöner, Coherent, Sweden
Robert Stahlbush, United States Naval Research Laboratory, USA
Hidekazu Tsuchida, Central Research Institute of Electric Power Industry (CRIEPI), Japan
Victor Veliadis, PowerAmerica, USA
Hiroshi Yano, University of Tsukuba, Japan
Advisory Panel
Wolfgang Jim Choyke, University of Pittsburgh, USA
Robert P. Devaty, University of Pittsburgh, USA
Philippe Godignon, CEA Leti, France
Francesco La Via, CNR-IMM, Italy
Hiroyuki Matsunami, Kyoto University, Japan
Technical Program Committee
Track 1: Material & Growth
Didier Chaussende, CNRS / Univ. Grenoble Alpes
Noboru Ohtani, Kwansei Gakuin University
Takeshi Ohshima, National Institutes for Quantum Science and Technology
Won-Jae Lee, Dongeui University
Francesco La Via, CNR – IMM
Hidekazu Tsuchida, Central Research Institute of Electric Power Industry (CRIEPI)
Adolf Schoner, Coherent
Marco Mauceri, ASM
Elif Balkas, Wolfspeed
Bernd Thomas, Bosch
Peder Bergman, Linköping University
Track 2: Defects and Characterization
Michael Dudley, Stony Brook University
Albert Burk, Coherent
Julie Widiez, CEA Leti
Yosiyuki Yonezawa
Jan Vobecky, University of Prague
Kumiko Konishi, Hitachi
Jean-François Michaud, University of Tours
Tsunenobu Kimoto, University of Kyoto
Robert Stahlbush, NASA
Martin Domeji, On Semiconductor
Gregor Pobegen, KAI GmbH
Track 3: Device Process and Characterization
Fabrizio Roccaforte, CNR-IMM
Ulrike Grossner, ETH Zurich – Advanced Power Semiconductor Laboratory
David Clark, ClasSiC Wafer FAb
Jun Zeng, Vishay-MaxPOwer
Simone Rascunà, ST Microelectronics
Mike Jennings, University of Swansea
Hiroshi Yano, University of Tsukuba
Gianpaolo Romano, Hitachi Energy
Philippe Godignon, CEA Leti
Peter Gammon, University of Warwick
Peter Friedrichs, Infineon
Daniel Alquier, GREMAN-CNRS
Track 4: Devices Physics, Design, and Characterization
Sang-Mo Koo, Kwangwoon University
Naruhisa Miura, Mitsubishi Electric
Sid Sundaresan, GeneSic Semiconductor
Luca Maresca, University of Naples Federico II
Marina Antoniou, University of Warwick
Kim Hyoung Woo, Korea Electrotechnology Research Institute
Andrei Mihaila, Hitachi Energy
Victor Veliadis, PowerAmerica
Mario Saggio, ST Microelectronics
Dethard Peters, Infineon
Kimimori Hamada, Huawei
Track 5: Quantum Applications and Sensors
Georgy Astakhov, Helmholtz-Zentrum Dresden-Rossendorf
Michel Bockstedte, Johannes Kepler University
Hisayoshi Itoh, National Institutes for Quantum Science and Technology (QST)
Philip Neudeck, NASA Glenn Research Center
Adam Gali, Wigner Research Centre for Physics
Iulian Nistor, mqSemi AG
Michael Krieger, Friedrich-Alexander-Universität Erlangen-Nürnberg
Hannes Kraus, NASA
Track 6: Reliability, applications and packaging
Peter Moens, ON Semiconductor
Dominique Planson, Ampere Laboratory
Neo Lophitis, University of Nottingham
Subhas Bose, StarPower
Idaka Shiori, Mitsubishi Electric Europe B.V.
Michele Riccio, University of Naples Federico II
Nando, Kaminski, University of Bremen
Don Gajewski, Wolfspeed
Arnost Kopta, SwissSEM Technologies